BibTeX record conf/i2mtc/LiuWYLLZ22

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@inproceedings{DBLP:conf/i2mtc/LiuWYLLZ22,
  author       = {Yajiao Liu and
                  Jiang Wang and
                  Haitao Yu and
                  Jiansheng Li and
                  Fulong Li and
                  Quanfa Zhao},
  title        = {A Non-Invasive System for On-line Surface Defect Detection on Special-shaped
                  Steel towards Real Production Lines},
  booktitle    = {{IEEE} International Instrumentation and Measurement Technology Conference,
                  {I2MTC} 2022, Ottawa, ON, Canada, May 16-19, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/I2MTC48687.2022.9806583},
  doi          = {10.1109/I2MTC48687.2022.9806583},
  timestamp    = {Thu, 02 Mar 2023 20:46:43 +0100},
  biburl       = {https://dblp.org/rec/conf/i2mtc/LiuWYLLZ22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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