BibTeX record conf/i2mtc/HacklPS22

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@inproceedings{DBLP:conf/i2mtc/HacklPS22,
  author       = {Thomas Hackl and
                  Mathias Poik and
                  Georg Schitter},
  title        = {DC-Bias-free Surface Potential Measurements by Heterodyne {AC} Kelvin
                  Probe Force Microscopy},
  booktitle    = {{IEEE} International Instrumentation and Measurement Technology Conference,
                  {I2MTC} 2022, Ottawa, ON, Canada, May 16-19, 2022},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/I2MTC48687.2022.9806676},
  doi          = {10.1109/I2MTC48687.2022.9806676},
  timestamp    = {Sun, 02 Oct 2022 16:02:50 +0200},
  biburl       = {https://dblp.org/rec/conf/i2mtc/HacklPS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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