BibTeX record conf/i2mtc/GiusiGSCRC15

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@inproceedings{DBLP:conf/i2mtc/GiusiGSCRC15,
  author       = {Gino Giusi and
                  Orazio Giordano and
                  Graziella Scandurra and
                  Carmine Ciofi and
                  Matteo Rapisarda and
                  Sabrina Calvi},
  title        = {Automatic measurement system for the {DC} and low-f noise characterization
                  of FETs at wafer level},
  booktitle    = {2015 {IEEE} International Instrumentation and Measurement Technology
                  Conference {(I2MTC)} Proceedings, Pisa, Italy, May 11-14, 2015},
  pages        = {2095--2100},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/I2MTC.2015.7151606},
  doi          = {10.1109/I2MTC.2015.7151606},
  timestamp    = {Thu, 14 Oct 2021 10:04:40 +0200},
  biburl       = {https://dblp.org/rec/conf/i2mtc/GiusiGSCRC15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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