BibTeX record conf/hldvt/0001BFS17

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@inproceedings{DBLP:conf/hldvt/0001BFS17,
  author       = {Binod Kumar and
                  Kanad Basu and
                  Masahiro Fujita and
                  Virendra Singh},
  title        = {{RTL} level trace signal selection and coverage estimation during
                  post-silicon validation},
  booktitle    = {2017 {IEEE} International High Level Design Validation and Test Workshop,
                  {HLDVT} 2017, Santa Cruz, CA, USA, October 5-6, 2017},
  pages        = {59--66},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/HLDVT.2017.8167464},
  doi          = {10.1109/HLDVT.2017.8167464},
  timestamp    = {Thu, 23 Mar 2023 23:58:58 +0100},
  biburl       = {https://dblp.org/rec/conf/hldvt/0001BFS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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