BibTeX
@inproceedings{DBLP:conf/glvlsi/ZhengSJ95,
author = {Hao Zheng and
Kewal K. Saluja and
Rajiv Jain},
title = {Test application time reduction for scan based sequential
circuits},
booktitle = {Great Lakes Symposium on VLSI},
year = {1995},
pages = {188-191},
ee = {http://csdl.computer.org/comp/proceedings/glsvlsi/1995/7035/00/70350188abs.htm},
crossref = {DBLP:conf/glvlsi/1995},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/glvlsi/1995,
title = {5th Great Lakes Symposium on VLSI (GLS-VLSI '95), March
16-18, 1995, The State University of New York at Buffalo,
USA},
booktitle = {Great Lakes Symposium on VLSI},
publisher = {IEEE Computer Society},
year = {1995},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2004-07-05 by Michael Ley (ley@uni-trier.de)