BibTeX record conf/glvlsi/WeyKLW04

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@inproceedings{DBLP:conf/glvlsi/WeyKLW04,
  author       = {Chin{-}Long Wey and
                  Mohammad Athar Khalil and
                  Jim Liu and
                  Gregory Wierzba},
  editor       = {David Garrett and
                  John C. Lach and
                  Charles A. Zukowski},
  title        = {Hierarchical extreme-voltage stress test of analog {CMOS} ICs for
                  gate-oxide reliability enhancement},
  booktitle    = {Proceedings of the 14th {ACM} Great Lakes Symposium on {VLSI} 2004,
                  Boston, MA, USA, April 26-28, 2004},
  pages        = {322--327},
  publisher    = {{ACM}},
  year         = {2004},
  url          = {https://doi.org/10.1145/988952.989030},
  doi          = {10.1145/988952.989030},
  timestamp    = {Fri, 20 Aug 2021 16:30:37 +0200},
  biburl       = {https://dblp.org/rec/conf/glvlsi/WeyKLW04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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