Irith Pomeranz Sudhakar M. Reddy ITEM: an iterative improvement test generation procedure for synchronous sequential circuits. 13-18 2001 conf/glvlsi/2001 ACM Great Lakes Symposium on VLSI http://doi.acm.org/10.1145/368122.368147 db/conf/glvlsi/glvlsi2001.html#PomeranzR01