Xrysovalantis Kavousianos Dimitris Bakalis Dimitris Nikolos A novel reseeding technique for accumulator-based test pattern generation. 7-12 2001 conf/glvlsi/2001 ACM Great Lakes Symposium on VLSI http://doi.acm.org/10.1145/368122.368145 db/conf/glvlsi/glvlsi2001.html#KavousianosBN01