Chuen-Song Chen Jien-Chung Lo Tian Xia An indirect current sensing technique for IDDQ and IDDT tests. 235-240 2006 conf/glvlsi/2006 ACM Great Lakes Symposium on VLSI http://doi.acm.org/10.1145/1127908.1127964 db/conf/glvlsi/glvlsi2006.html#ChenLX06