A novel test-data compression technique using application-aware bitmask and dictionary selection methods.

Kanad Basu Prabhat Mishra A novel test-data compression technique using application-aware bitmask and dictionary selection methods. 83-88 2008 ACM Great Lakes Symposium on VLSI http://doi.acm.org/10.1145/1366110.1366132 conf/glvlsi/2008 db/conf/glvlsi/glvlsi2008.html#BasuM08