Ali Bastani Charles A. Zukowski Characterization of monotonic static CMOS gates in a 65nm technology. 408-411 2005 conf/glvlsi/2005 ACM Great Lakes Symposium on VLSI http://doi.acm.org/10.1145/1057661.1057758 db/conf/glvlsi/glvlsi2005.html#BastaniZ05