BibTeX record conf/gcce/YamaneU20

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@inproceedings{DBLP:conf/gcce/YamaneU20,
  author       = {Satoshi Yamane and
                  Kosuke Uemura},
  title        = {Comparative Experiment of {SPIN} and {SMT} in Model Checking of Embedded
                  Assembly Program},
  booktitle    = {9th {IEEE} Global Conference on Consumer Electronics, {GCCE} 2020,
                  Kobe, Japan, October 13-16, 2020},
  pages        = {54--57},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/GCCE50665.2020.9291772},
  doi          = {10.1109/GCCE50665.2020.9291772},
  timestamp    = {Wed, 13 Jan 2021 16:13:52 +0100},
  biburl       = {https://dblp.org/rec/conf/gcce/YamaneU20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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