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BibTeX record conf/ftcs/UdellM89
@inproceedings{DBLP:conf/ftcs/UdellM89, author = {Jon G. Jr. Udell and Edward J. McCluskey}, title = {Pseudo-exhaustive test and segmentation: formal definitions and extended fault coverage results}, booktitle = {Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, {FTCS} 1989, Chicago, IL, USA, 21-23 June, 1989}, pages = {292--298}, publisher = {{IEEE} Computer Society}, year = {1989}, url = {https://doi.org/10.1109/FTCS.1989.105582}, doi = {10.1109/FTCS.1989.105582}, timestamp = {Wed, 16 Oct 2019 14:14:57 +0200}, biburl = {https://dblp.org/rec/conf/ftcs/UdellM89.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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