BibTeX record conf/ftcs/NachmanSUR96

download as .bib file

@inproceedings{DBLP:conf/ftcs/NachmanSUR96,
  author       = {Lama Nachman and
                  Kewal K. Saluja and
                  Shambhu J. Upadhyaya and
                  Robert Reuse},
  title        = {Random Pattern Testing for Sequential Circuits Revisited},
  booktitle    = {Digest of Papers: FTCS-26, The Twenty-Sixth Annual International Symposium
                  on Fault-Tolerant Computing, Sendai, Japan, June 25-27, 1996},
  pages        = {44--52},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/FTCS.1996.534593},
  doi          = {10.1109/FTCS.1996.534593},
  timestamp    = {Fri, 24 Mar 2023 00:03:46 +0100},
  biburl       = {https://dblp.org/rec/conf/ftcs/NachmanSUR96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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