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@inproceedings{DBLP:conf/ftcs/KanekawaNSS96,
author = {Nobuyasu Kanekawa and
Makoto Nohmi and
Yoshimichi Satoh and
Hiroshi Satoh},
title = {Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy},
booktitle = {FTCS},
year = {1996},
pages = {426-430},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2002-01-03 by Michael Ley (ley@uni-trier.de)