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BibTeX record conf/ftcs/BlantonH93
@inproceedings{DBLP:conf/ftcs/BlantonH93, author = {Ronald D. Blanton and John P. Hayes}, title = {Efficient Testing of Tree Circuits}, booktitle = {Digest of Papers: FTCS-23, The Twenty-Third Annual International Symposium on Fault-Tolerant Computing, Toulouse, France, June 22-24, 1993}, pages = {176--185}, publisher = {{IEEE} Computer Society}, year = {1993}, url = {https://doi.org/10.1109/FTCS.1993.627321}, doi = {10.1109/FTCS.1993.627321}, timestamp = {Wed, 16 Oct 2019 14:14:57 +0200}, biburl = {https://dblp.org/rec/conf/ftcs/BlantonH93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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