BibTeX record conf/ftcs/BlantonH93

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@inproceedings{DBLP:conf/ftcs/BlantonH93,
  author       = {Ronald D. Blanton and
                  John P. Hayes},
  title        = {Efficient Testing of Tree Circuits},
  booktitle    = {Digest of Papers: FTCS-23, The Twenty-Third Annual International Symposium
                  on Fault-Tolerant Computing, Toulouse, France, June 22-24, 1993},
  pages        = {176--185},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/FTCS.1993.627321},
  doi          = {10.1109/FTCS.1993.627321},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/ftcs/BlantonH93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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