Migration of a Dual Granularity Globally Interconnected PLD Architecture to a 0.5 µm TLM Process.

J. Turner Richard Cliff W. Leong Cameron McClintock Ninh Ngo K. Nguyen C. K. Sung B. Wang J. Watson Migration of a Dual Granularity Globally Interconnected PLD Architecture to a 0.5 µm TLM Process. 15-20 1995 conf/fpl/1995 FPL db/conf/fpl/fpl1995.html#TurnerCLMNNSWW95