Matthias Woehrle Kai Lampka Lothar Thiele Exploiting Timed Automata for Conformance Testing of Power Measurements. 275-290 2009 FORMATS http://dx.doi.org/10.1007/978-3-642-04368-0_21 conf/formats/2009 db/conf/formats/formats2009.html#WoehrleLT09