The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets.

Michael J. Wirthlin Darrel Eric Johnson Nathan Rollins Michael Caffrey Paul Graham The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets. 133-142 2003 conf/fccm/2003 FCCM http://csdl.computer.org/comp/proceedings/fccm/2003/1979/00/19790133abs.htm db/conf/fccm/fccm2003.html#WirthlinJRCG03