Imed Hammouda Markku Hakala Mika Pussinen Mika Katara Tommi Mikkonen Concern-Based Development of Pattern Systems. 113-129 2005 conf/ewsa/2005 EWSA http://dx.doi.org/10.1007/11494713_8 db/conf/ewsa/ewsa2005.html#HammoudaHPKM05