BibTeX record conf/ewdts/SokolovSDRD20

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@inproceedings{DBLP:conf/ewdts/SokolovSDRD20,
  author       = {Igor Sokolov and
                  Yuri Stepchenkov and
                  Yuri Diachenko and
                  Yuri Rogdestvenski and
                  Denis Diachenko},
  title        = {Increasing Self-Timed Circuit Soft Error Tolerance},
  booktitle    = {{IEEE} East-West Design {\&} Test Symposium, {EWDTS} 2020, Varna,
                  Bulgaria, September 4-7, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/EWDTS50664.2020.9224705},
  doi          = {10.1109/EWDTS50664.2020.9224705},
  timestamp    = {Thu, 22 Oct 2020 12:37:01 +0200},
  biburl       = {https://dblp.org/rec/conf/ewdts/SokolovSDRD20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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