BibTeX record conf/ewdts/PetrosyantsK18

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@inproceedings{DBLP:conf/ewdts/PetrosyantsK18,
  author       = {Konstantin O. Petrosyants and
                  Igor A. Kharitonov},
  title        = {{SPICE} Simulation of Total Dose and Aging Effects in {MOSFET} Circuits},
  booktitle    = {2018 {IEEE} East-West Design {\&} Test Symposium, {EWDTS} 2018,
                  Kazan, Russia, September 14-17, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/EWDTS.2018.8524852},
  doi          = {10.1109/EWDTS.2018.8524852},
  timestamp    = {Mon, 09 Aug 2021 14:53:48 +0200},
  biburl       = {https://dblp.org/rec/conf/ewdts/PetrosyantsK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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