BibTeX record conf/ewdts/KatuninS19

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@inproceedings{DBLP:conf/ewdts/KatuninS19,
  author       = {Yuri V. Katunin and
                  Vladimir Ya. Stenin},
  title        = {The Fault Tolerant {CMOS} Logical C-Element for Digital Devices Resistant
                  to Single Nuclear Particles},
  booktitle    = {2019 {IEEE} East-West Design {\&} Test Symposium, {EWDTS} 2019,
                  Batumi, Georgia, September 13-16, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/EWDTS.2019.8884458},
  doi          = {10.1109/EWDTS.2019.8884458},
  timestamp    = {Tue, 12 Nov 2019 10:37:23 +0100},
  biburl       = {https://dblp.org/rec/conf/ewdts/KatuninS19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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