BibTeX record conf/ewdts/AndrienkoDRU13

download as .bib file

@inproceedings{DBLP:conf/ewdts/AndrienkoDRU13,
  author       = {V. A. Andrienko and
                  Moamar Diaa and
                  V. G. Ryabtsev and
                  Tetyana Utkina},
  title        = {Architecture of built-in self-test and recovery memory chips},
  booktitle    = {East-West Design {\&} Test Symposium, {EWDTS} 2013, Rostov-on-Don,
                  Russia, September 27-30, 2013},
  pages        = {1--12},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/EWDTS.2013.6673185},
  doi          = {10.1109/EWDTS.2013.6673185},
  timestamp    = {Thu, 23 Mar 2023 23:58:25 +0100},
  biburl       = {https://dblp.org/rec/conf/ewdts/AndrienkoDRU13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.