BibTeX record conf/eurodac/LinGB94

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@inproceedings{DBLP:conf/eurodac/LinGB94,
  author       = {Sen{-}Pin Lin and
                  Sandeep K. Gupta and
                  Melvin A. Breuer},
  editor       = {Robert Werner},
  title        = {A Low Cost {BIST} Methodology and Associated Novel Test Pattern Generator},
  booktitle    = {{EDAC} - The European Conference on Design Automation, {ETC} - European
                  Test Conference, {EUROASIC} - The European Event in {ASIC} Design,
                  Proceedings, February 28 - March 3, 1994, Paris, France},
  pages        = {106--112},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/EDTC.1994.326890},
  doi          = {10.1109/EDTC.1994.326890},
  timestamp    = {Thu, 21 Sep 2023 10:09:54 +0200},
  biburl       = {https://dblp.org/rec/conf/eurodac/LinGB94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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