A Functional Approach to Delay Faults Test Generation for Sequential Circuits.

Franco Fummi Donatella Sciuto Micaela Serra A Functional Approach to Delay Faults Test Generation for Sequential Circuits. 51-57 1994 conf/eurodac/1994edac EDAC-ETC-EUROASIC db/conf/eurodac/eurodac1994.html#FummiSS94