BibTeX record conf/eurocon/FranckenPSB23

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@inproceedings{DBLP:conf/eurocon/FranckenPSB23,
  author       = {Nicholas Francken and
                  Pavel Paramonov and
                  Jan Sijbers and
                  Jan De Beenhouwer},
  title        = {Enhancing Industrial Inspection with Efficient Edge Illumination X-Ray
                  Phase Contrast Simulations},
  booktitle    = {20th {IEEE} International Conference on Smart Technologies, {EUROCON}
                  2023, Torino, Italy, July 6-8, 2023},
  pages        = {723--727},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/EUROCON56442.2023.10199074},
  doi          = {10.1109/EUROCON56442.2023.10199074},
  timestamp    = {Mon, 05 Feb 2024 20:32:05 +0100},
  biburl       = {https://dblp.org/rec/conf/eurocon/FranckenPSB23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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