BibTeX record conf/ets/YiH01

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@inproceedings{DBLP:conf/ets/YiH01,
  author       = {Joonhwan Yi and
                  John P. Hayes},
  title        = {A fault model for function and delay testing},
  booktitle    = {6th European Test Workshop, {ETW} 2001, Stockholm, Sweden, May 29
                  - June 1, 2001},
  pages        = {27--34},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/ETW.2001.946657},
  doi          = {10.1109/ETW.2001.946657},
  timestamp    = {Tue, 28 Apr 2020 13:03:47 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/YiH01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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