BibTeX record conf/ets/XunFYZTH23

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@inproceedings{DBLP:conf/ets/XunFYZTH23,
  author       = {Hanzhi Xun and
                  Moritz Fieback and
                  Sicong Yuan and
                  Ziwei Zhang and
                  Mottaqiallah Taouil and
                  Said Hamdioui},
  title        = {Data Background-Based Test Development for All Interconnect and Contact
                  Defects in RRAMs},
  booktitle    = {{IEEE} European Test Symposium, {ETS} 2023, Venezia, Italy, May 22-26,
                  2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ETS56758.2023.10174106},
  doi          = {10.1109/ETS56758.2023.10174106},
  timestamp    = {Sat, 30 Sep 2023 09:40:35 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/XunFYZTH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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