BibTeX record conf/ets/XhafaGV23

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@inproceedings{DBLP:conf/ets/XhafaGV23,
  author       = {Xhesila Xhafa and
                  Patrick Girard and
                  Arnaud Virazel},
  title        = {Learning-Based Characterization Models for Quality Assurance of Emerging
                  Memory Technologies},
  booktitle    = {{IEEE} European Test Symposium, {ETS} 2023, Venezia, Italy, May 22-26,
                  2023},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ETS56758.2023.10174202},
  doi          = {10.1109/ETS56758.2023.10174202},
  timestamp    = {Fri, 14 Jul 2023 22:01:39 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/XhafaGV23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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