BibTeX record conf/ets/WenMKFYTNIHAS08

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@inproceedings{DBLP:conf/ets/WenMKFYTNIHAS08,
  author       = {Xiaoqing Wen and
                  Kohei Miyase and
                  Seiji Kajihara and
                  Hiroshi Furukawa and
                  Yuta Yamato and
                  Atsushi Takashima and
                  Kenji Noda and
                  Hideaki Ito and
                  Kazumi Hatayama and
                  Takashi Aikyo and
                  Kewal K. Saluja},
  title        = {A Capture-Safe Test Generation Scheme for At-Speed Scan Testing},
  booktitle    = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29,
                  2008},
  pages        = {55--60},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/ETS.2008.13},
  doi          = {10.1109/ETS.2008.13},
  timestamp    = {Thu, 23 Mar 2023 23:58:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/WenMKFYTNIHAS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}