BibTeX record conf/ets/VirazelDGLP00

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@inproceedings{DBLP:conf/ets/VirazelDGLP00,
  author       = {Arnaud Virazel and
                  Ren{\'{e}} David and
                  Patrick Girard and
                  Christian Landrault and
                  Serge Pravossoudovitch},
  title        = {Delay fault testing: choosing between random {SIC} and random {MIC}
                  test sequences},
  booktitle    = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26,
                  2000},
  pages        = {9--14},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ETW.2000.873772},
  doi          = {10.1109/ETW.2000.873772},
  timestamp    = {Tue, 21 Mar 2023 20:55:31 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/VirazelDGLP00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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