@inproceedings{DBLP:conf/ets/VerbreeMRV10,
  author    = {Jouke Verbree and
               Erik Jan Marinissen and
               Philippe Roussel and
               Dimitrios Velenis},
  title     = {On the cost-effectiveness of matching repositories of pre-tested
               wafers for wafer-to-wafer 3D chip stacking},
  booktitle = {European Test Symposium},
  year      = {2010},
  pages     = {36-41},
  ee        = {http://dx.doi.org/10.1109/ETSYM.2010.5512785},
  crossref  = {DBLP:conf/ets/2010},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ets/2010,
  title     = {15th European Test Symposium (ETS 2010), May 24-28, 2010,
               Prague, Czech Republic},
  booktitle = {European Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2010},
  isbn      = {978-1-4244-5833-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}