Huaxing Tang Manish Sharma Janusz Rajski Martin Keim Brady Benware Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. 145-150 2007 conf/ets/2007 European Test Symposium http://doi.ieeecomputersociety.org/10.1109/ETS.2007.11 db/conf/ets/ets2007.html#TangMRKB07