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BibTeX record conf/ets/SehgalDMWVC03
@inproceedings{DBLP:conf/ets/SehgalDMWVC03, author = {Anuja Sehgal and Aishwarya Dubey and Erik Jan Marinissen and Clemens Wouters and Harald P. E. Vranken and Krishnendu Chakrabarty}, title = {Yield analysis for repairable embedded memories}, booktitle = {8th European Test Workshop, {ETW} 2003, Maastricht, The Netherlands, May 25-28, 2003}, pages = {35--40}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/ETW.2003.1231666}, doi = {10.1109/ETW.2003.1231666}, timestamp = {Mon, 05 Feb 2024 20:31:45 +0100}, biburl = {https://dblp.org/rec/conf/ets/SehgalDMWVC03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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