BibTeX record conf/ets/SehgalDMWVC03

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@inproceedings{DBLP:conf/ets/SehgalDMWVC03,
  author       = {Anuja Sehgal and
                  Aishwarya Dubey and
                  Erik Jan Marinissen and
                  Clemens Wouters and
                  Harald P. E. Vranken and
                  Krishnendu Chakrabarty},
  title        = {Yield analysis for repairable embedded memories},
  booktitle    = {8th European Test Workshop, {ETW} 2003, Maastricht, The Netherlands,
                  May 25-28, 2003},
  pages        = {35--40},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/ETW.2003.1231666},
  doi          = {10.1109/ETW.2003.1231666},
  timestamp    = {Mon, 05 Feb 2024 20:31:45 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/SehgalDMWVC03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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