BibTeX record conf/ets/SchubertA99

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@inproceedings{DBLP:conf/ets/SchubertA99,
  author       = {A. Schubert and
                  Walter Anheier},
  title        = {On random pattern testability of cryptographic {VLSI} cores},
  booktitle    = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28,
                  1999},
  pages        = {15--20},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ETW.1999.803820},
  doi          = {10.1109/ETW.1999.803820},
  timestamp    = {Tue, 28 Apr 2020 13:37:50 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/SchubertA99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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