BibTeX record conf/ets/Sanada00

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@inproceedings{DBLP:conf/ets/Sanada00,
  author       = {Masaru Sanada},
  title        = {Defect detection from visual abnormalities in manufacturing process
                  using I\({}_{\mbox{DDQ}}\)},
  booktitle    = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26,
                  2000},
  pages        = {39--44},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ETW.2000.873777},
  doi          = {10.1109/ETW.2000.873777},
  timestamp    = {Wed, 28 Jul 2021 14:18:33 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Sanada00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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