BibTeX record conf/ets/RaychowdhuryGBGR05

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@inproceedings{DBLP:conf/ets/RaychowdhuryGBGR05,
  author       = {Arijit Raychowdhury and
                  Swaroop Ghosh and
                  Swarup Bhunia and
                  Debjyoti Ghosh and
                  Kaushik Roy},
  title        = {A novel delay fault testing methodology using on-chip low-overhead
                  delay measurement hardware at strategic probe points},
  booktitle    = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25,
                  2005},
  pages        = {108--113},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ETS.2005.2},
  doi          = {10.1109/ETS.2005.2},
  timestamp    = {Thu, 23 Mar 2023 23:58:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/RaychowdhuryGBGR05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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