BibTeX record conf/ets/RaikU99

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@inproceedings{DBLP:conf/ets/RaikU99,
  author       = {Jaan Raik and
                  Raimund Ubar},
  title        = {High-level path activation technique to speed up sequential circuit
                  test generation},
  booktitle    = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28,
                  1999},
  pages        = {84--89},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ETW.1999.804289},
  doi          = {10.1109/ETW.1999.804289},
  timestamp    = {Sun, 25 Oct 2020 23:09:01 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/RaikU99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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