![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record conf/ets/RaikU99
@inproceedings{DBLP:conf/ets/RaikU99, author = {Jaan Raik and Raimund Ubar}, title = {High-level path activation technique to speed up sequential circuit test generation}, booktitle = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28, 1999}, pages = {84--89}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ETW.1999.804289}, doi = {10.1109/ETW.1999.804289}, timestamp = {Sun, 25 Oct 2020 23:09:01 +0100}, biburl = {https://dblp.org/rec/conf/ets/RaikU99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.