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BibTeX record conf/ets/PomeranzR00
@inproceedings{DBLP:conf/ets/PomeranzR00, author = {Irith Pomeranz and Sudhakar M. Reddy}, title = {On the use of multiple fault detection times in a method for built-in test pattern generation for synchronous sequential circuits}, booktitle = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26, 2000}, pages = {144--149}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/ETW.2000.873792}, doi = {10.1109/ETW.2000.873792}, timestamp = {Tue, 28 Apr 2020 13:03:47 +0200}, biburl = {https://dblp.org/rec/conf/ets/PomeranzR00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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