On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture.

Frank Poehl Jan Rzeha Matthias Beck Michael Gössel Ralf Arnold Peter Ossimitz On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. 239-246 2006 conf/ets/2006 European Test Symposium http://doi.ieeecomputersociety.org/10.1109/ETS.2006.34 db/conf/ets/ets2006.html#PoehlRBGAO06