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BibTeX record conf/ets/NeyGLPVB07
@inproceedings{DBLP:conf/ets/NeyGLPVB07, author = {Alexandre Ney and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian}, title = {Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs}, booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20, 2007}, pages = {97--104}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/ETS.2007.19}, doi = {10.1109/ETS.2007.19}, timestamp = {Thu, 23 Mar 2023 23:58:22 +0100}, biburl = {https://dblp.org/rec/conf/ets/NeyGLPVB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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