BibTeX record conf/ets/MunchYKT21

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@inproceedings{DBLP:conf/ets/MunchYKT21,
  author       = {Christopher M{\"{u}}nch and
                  Jongsin Yun and
                  Martin Keim and
                  Mehdi B. Tahoori},
  title        = {MBIST-supported Trim Adjustment to Compensate Thermal Behavior of
                  {MRAM}},
  booktitle    = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
                  May 24-28, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ETS50041.2021.9465383},
  doi          = {10.1109/ETS50041.2021.9465383},
  timestamp    = {Fri, 02 Jul 2021 14:32:49 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MunchYKT21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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