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BibTeX record conf/ets/MoermanBV03
@inproceedings{DBLP:conf/ets/MoermanBV03, author = {Erik Moerman and S{\'{e}}bastien Bocq and Johan Verfaillie}, title = {Debug architecture for system on chip taking full advantage of the test access port}, booktitle = {8th European Test Workshop, {ETW} 2003, Maastricht, The Netherlands, May 25-28, 2003}, pages = {155--159}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/ETW.2003.1231683}, doi = {10.1109/ETW.2003.1231683}, timestamp = {Tue, 28 Apr 2020 10:30:50 +0200}, biburl = {https://dblp.org/rec/conf/ets/MoermanBV03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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