BibTeX record conf/ets/MoermanBV03

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@inproceedings{DBLP:conf/ets/MoermanBV03,
  author       = {Erik Moerman and
                  S{\'{e}}bastien Bocq and
                  Johan Verfaillie},
  title        = {Debug architecture for system on chip taking full advantage of the
                  test access port},
  booktitle    = {8th European Test Workshop, {ETW} 2003, Maastricht, The Netherlands,
                  May 25-28, 2003},
  pages        = {155--159},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/ETW.2003.1231683},
  doi          = {10.1109/ETW.2003.1231683},
  timestamp    = {Tue, 28 Apr 2020 10:30:50 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MoermanBV03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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