BibTeX record conf/ets/MhamdiGVBL20

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@inproceedings{DBLP:conf/ets/MhamdiGVBL20,
  author       = {Safa Mhamdi and
                  Patrick Girard and
                  Arnaud Virazel and
                  Alberto Bosio and
                  Aymen Ladhar},
  title        = {Learning-Based Cell-Aware Defect Diagnosis of Customer Returns},
  booktitle    = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
                  25-29, 2020},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ETS48528.2020.9131601},
  doi          = {10.1109/ETS48528.2020.9131601},
  timestamp    = {Tue, 21 Mar 2023 20:55:30 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/MhamdiGVBL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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