BibTeX record conf/ets/MayugaYYSI16

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@inproceedings{DBLP:conf/ets/MayugaYYSI16,
  author       = {Gian Mayuga and
                  Yuta Yamato and
                  Tomokazu Yoneda and
                  Yasuo Sato and
                  Michiko Inoue},
  title        = {Reliability enhancement of embedded memory with combination of aging-aware
                  adaptive in-field self-repair and {ECC}},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519284},
  doi          = {10.1109/ETS.2016.7519284},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MayugaYYSI16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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