BibTeX record conf/ets/LiLCCHWH20

download as .bib file

@inproceedings{DBLP:conf/ets/LiLCCHWH20,
  author       = {Katherine Shu{-}Min Li and
                  Peter Yi{-}Yu Liao and
                  Leon Chou and
                  Ken Chau{-}Cheung Cheng and
                  Andrew Yi{-}Ann Huang and
                  Sying{-}Jyan Wang and
                  Gus Chang{-}Hung Han},
  title        = {{PWS:} Potential Wafermap Scratch Defect Pattern Recognition with
                  Machine Learning Techniques},
  booktitle    = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
                  25-29, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ETS48528.2020.9131598},
  doi          = {10.1109/ETS48528.2020.9131598},
  timestamp    = {Sun, 02 Oct 2022 16:00:47 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/LiLCCHWH20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.