BibTeX record conf/ets/Kruseman00

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@inproceedings{DBLP:conf/ets/Kruseman00,
  author       = {Bram Kruseman},
  title        = {Comparison of defect detection capabilities of current-based and voltage-based
                  test methods},
  booktitle    = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26,
                  2000},
  pages        = {175--180},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ETW.2000.873796},
  doi          = {10.1109/ETW.2000.873796},
  timestamp    = {Tue, 28 Apr 2020 13:03:46 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Kruseman00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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