Tomoo Inoue Takashi Fujii Hideyuki Ichihara Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. 117-124 2007 conf/ets/2007 European Test Symposium http://doi.ieeecomputersociety.org/10.1109/ETS.2007.29 db/conf/ets/ets2007.html#InoueFI07