BibTeX record conf/ets/InceO20

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@inproceedings{DBLP:conf/ets/InceO20,
  author       = {Mehmet Ince and
                  Sule Ozev},
  title        = {Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators},
  booktitle    = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
                  25-29, 2020},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ETS48528.2020.9131577},
  doi          = {10.1109/ETS48528.2020.9131577},
  timestamp    = {Wed, 15 Jul 2020 13:24:18 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/InceO20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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